JPH0731182Y2 - 半導体素子の検査用ケース - Google Patents

半導体素子の検査用ケース

Info

Publication number
JPH0731182Y2
JPH0731182Y2 JP13706489U JP13706489U JPH0731182Y2 JP H0731182 Y2 JPH0731182 Y2 JP H0731182Y2 JP 13706489 U JP13706489 U JP 13706489U JP 13706489 U JP13706489 U JP 13706489U JP H0731182 Y2 JPH0731182 Y2 JP H0731182Y2
Authority
JP
Japan
Prior art keywords
case
test
contact
test board
pogo pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP13706489U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0376184U (en]
Inventor
貢 栗原
Original Assignee
株式会社ダイトー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社ダイトー filed Critical 株式会社ダイトー
Priority to JP13706489U priority Critical patent/JPH0731182Y2/ja
Publication of JPH0376184U publication Critical patent/JPH0376184U/ja
Application granted granted Critical
Publication of JPH0731182Y2 publication Critical patent/JPH0731182Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP13706489U 1989-11-27 1989-11-27 半導体素子の検査用ケース Expired - Fee Related JPH0731182Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13706489U JPH0731182Y2 (ja) 1989-11-27 1989-11-27 半導体素子の検査用ケース

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13706489U JPH0731182Y2 (ja) 1989-11-27 1989-11-27 半導体素子の検査用ケース

Publications (2)

Publication Number Publication Date
JPH0376184U JPH0376184U (en]) 1991-07-30
JPH0731182Y2 true JPH0731182Y2 (ja) 1995-07-19

Family

ID=31684240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13706489U Expired - Fee Related JPH0731182Y2 (ja) 1989-11-27 1989-11-27 半導体素子の検査用ケース

Country Status (1)

Country Link
JP (1) JPH0731182Y2 (en])

Also Published As

Publication number Publication date
JPH0376184U (en]) 1991-07-30

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